Modified March C-With Concurrency in Testing for Embedded Memory Applications
نویسندگان
چکیده
منابع مشابه
Optimizing March Algorithm for Testing Embedded Memory: a Case Study
The increase in integrity of the recent VLSI technology has enabled a trend of a lot of new, small and portable applications. The popularity of these portable applications, for ex notebook computers and cellular phones demand even higher performance and lower-power consumption. Embedded semiconductor memories form a big portion of the overall hardware on these portable devices. Testing the semi...
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ژورنال
عنوان ژورنال: International Journal of VLSI Design & Communication Systems
سال: 2012
ISSN: 0976-1527
DOI: 10.5121/vlsic.2012.3504